JTAG Maps
JTAG Maps™ enhances the JTAG testing process by enabling engineers to quickly evaluate boundary-scan net access and prepare test data efficiently. This Altium extension eliminates the tedious task of manual net highlighting, streamlining Design for Test (DfT) workflows and facilitating faster time-to-market with its flexible BSDL model integration and coverage reporting features.
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Top JTAG Maps Features
- Boundary-scan net mapping
- Intuitive Altium extension
- Quick test possibility assessment
- Automated coverage reporting
- Supports BSDL model files
- 'Assume scan covered' option
- Import/export capability
- Detailed fault-coverage information
- Enhanced Design for Test process
- Time-saving automation
- Visual highlighting of nets
- User-friendly interface
- Seamless integration with Altium
- Flexible testing configurations
- Comprehensive analytics support
- Streamlined JTAG testing workflow
- Detailed coverage visualization
- Reduced manual effort
- Improved time to market.
